by L. Blanquart, J. Richardson, K. Einsweiler, P. Fischer, E. Mandelli, G. Meddeler and I. Peric
Reference:
FE-I2: a front-end readout chip designed in a commercial $ 0.25 \mu {}m $ process for the ATLAS pixel detector at LHC (L. Blanquart, J. Richardson, K. Einsweiler, P. Fischer, E. Mandelli, G. Meddeler and I. Peric), In Nuclear Science, IEEE Transactions on, volume 51, 2004.
Bibtex Entry:
@Article{1323697,
author = "L. Blanquart and J. Richardson and K. Einsweiler and
P. Fischer and E. Mandelli and G. Meddeler and I.
Peric",
journal = "Nuclear Science, IEEE Transactions on",
title = "{FE-I2}: a front-end readout chip designed in a
commercial $ 0.25 \mu {}m $ process for the {ATLAS}
pixel detector at {LHC}",
year = "2004",
volume = "51",
number = "4",
pages = "1358--1364",
keywords = "high energy physics instrumentation computing;leakage
currents;nuclear electronics;position sensitive
particle detectors;readout electronics;silicon
radiation detectors;ATLAS pixel detector;CERN;CMOS
process;FE-I1;FE-I2 front-end readout chip;LHC;Large
Hadron Collider accelerator facility;active bias
distribution;automatic threshold tuning
circuitry;buffers;capacitance calibration charge-pump
circuit;charge-sensitive amplifier;detection
threshold;differential readout circuit;digital hit
emulation;digital pick-up reduction;embedded smart
decoupling capacitances;fast discriminator;hybrid pixel
sensor;ionizing radiation dose;leakage current
compensation;leakage current monitoring circuit;linear
regulator;long term overvoltage protection;multichip
module;pixel element dimension;power-on
reset;preamplifier-kill;radiation tolerance;readout
mask;recovery-time;shielding
technique;single-event-upset-tolerant DAC;slow control
logic;threshold
adjustment;time-over-threshold;time-stamped
data;wired-hit-Or; Automatic control;Automatic logic
units;CMOS
process;Capacitance;Circuits;Detectors;Electrons;Laboratories;Large
Hadron Collider;Particle accelerators",
DOI = "10.1109/TNS.2004.832895",
ISSN = "0018-9499",
month = aug,
}