@Article{1323757,
  author =       "Mario Locker and P. Fischer and S. Krimmel and H.
                 Kruger and M. Lindner and K. Nakazawa and T. Takahashi
                 and N. Wermes",
  journal =      "Nuclear Science, IEEE Transactions on",
  title =        "Single photon counting X-ray imaging with Si and
                 {CdTe} single chip pixel detectors and multichip pixel
                 modules",
  year =         "2004",
  volume =       "51",
  number =       "4",
  pages =        "1717--1723",
  keywords =     "X-ray imaging;multichip modules;photon
                 counting;position sensitive particle detectors;readout
                 electronics;semiconductor counters;silicon radiation
                 detectors;1 MHz;1.3 cm;1024 pixel;200 micron;32
                 pixel;4096 pixel;64 pixel;CdTe single chip pixel
                 detectors;MCM;MPEC 2.3 chips;Si single chip pixel
                 detectors;USB readout system;bits;bump
                 bonding;continuously adjustable
                 thresholds;counters;energy windowing;imaging
                 performance;multichip pixel modules;pixel count
                 rate;pixel size;sensor pixel geometry;single photon
                 counting X-ray imaging;Bonding;Counting
                 circuits;Dynamic range;Multichip modules;Optoelectronic
                 and photonic sensors;Pixel;Sensor arrays;X-ray
                 detection;X-ray detectors;X-ray imaging",
  DOI =          "10.1109/TNS.2004.832610",
  ISSN =         "0018-9499",
  month =        aug,
}