by J. Treis, P. Fischer, O. Halker, M. Harter, S. Herrmann, R. Kohrs, H. Krüger, P. Lechner, G. Lutz, I. Perić, M. Porro, R. H. Richter, L. Struder, M. Trimpl and N. Wermes
Reference:
DEPMOSFET Active Pixel Sensor Prototypes for the XEUS Wide Field Imager (J. Treis, P. Fischer, O. Halker, M. Harter, S. Herrmann, R. Kohrs, H. Krüger, P. Lechner, G. Lutz, I. Perić, M. Porro, R. H. Richter, L. Struder, M. Trimpl and N. Wermes), In Nuclear Science, IEEE Transactions on, volume 52, 2005.
Bibtex Entry:
@Article{1495809,
author = "J. Treis and P. Fischer and O. Halker and M. Harter
and S. Herrmann and R. Kohrs and H. Krüger and P.
Lechner and G. Lutz and I. Perić and M. Porro and R.
H. Richter and L. Struder and M. Trimpl and N. Wermes",
journal = "Nuclear Science, IEEE Transactions on",
title = "{DEPMOSFET} Active Pixel Sensor Prototypes for the
{XEUS} Wide Field Imager",
year = "2005",
volume = "52",
number = "4",
pages = "1083--1091",
keywords = "CMOS integrated circuits;X-ray apparatus;X-ray
astronomy;astronomical techniques;data
acquisition;readout electronics;semiconductor
counters;4096 pixel;64 channel parallel CMOS
amplifier/multiplexer IC;64 pixel;75 micron;8-fold
correlated double sampling;DAQ;DEPFET;DEPMOSFET active
pixel sensor prototypes;MPI semiconductor
laboratory;SWITCHER type IC;X-ray astronomy;X-ray
evolving universe spectroscopy;XEUS wide field
imager;charge amplifier multiplexer;charge collection
efficiency;control IC;data acquisition system;depleted
P-channel MOSFET;fast readout speed;first prototype
production;front-end IC;high energy resolution;high
voltage CMOS technology;highly flexible readout
modes;key performance parameters;large area imaging;low
power consumption;noise;one single matrix
row;performance characterization;random
accessibility;spectral resolution;spectroscopy
detector;CMOS technology;Data
acquisition;High-resolution imaging;Image
sensors;Laboratories;MOSFET
circuits;Multiplexing;Optical imaging;Pixel;
Prototypes;Active pixel sensor (APS);DEPFET;X-ray;X-ray
evolving universe spectroscopy (XEUS);data acquisition
(DAQ);imaging;spectroscopy",
DOI = "10.1109/TNS.2005.852673",
ISSN = "0018-9499",
month = aug,
}