Development of a Prototype Module for a DEPFET Pixel Vertex Detector for a Linear Collider (bibtex)
by R. Kohrs, L. Andricek, P. Fischer, M. Harter, M. Karagounis, H. Krüger, G. Lutz, H. G. Moser, I. Perić, M. Porro, L. Reuen, R. H. Richter, C. Sandow, L. Struder, M. Trimpl and N. Wermes
Reference:
Development of a Prototype Module for a DEPFET Pixel Vertex Detector for a Linear Collider (R. Kohrs, L. Andricek, P. Fischer, M. Harter, M. Karagounis, H. Krüger, G. Lutz, H. G. Moser, I. Perić, M. Porro, L. Reuen, R. H. Richter, C. Sandow, L. Struder, M. Trimpl and N. Wermes), In Nuclear Science, IEEE Transactions on, volume 52, 2005.
Bibtex Entry:
@Article{1495824,
  author =       "R. Kohrs and L. Andricek and P. Fischer and M. Harter
                 and M. Karagounis and H. Krüger and G. Lutz and H. G.
                 Moser and I. Perić and M. Porro and L. Reuen and R. H.
                 Richter and C. Sandow and L. Struder and M. Trimpl and
                 N. Wermes",
  journal =      "Nuclear Science, IEEE Transactions on",
  title =        "Development of a Prototype Module for a {DEPFET} Pixel
                 Vertex Detector for a Linear Collider",
  year =         "2005",
  volume =       "52",
  number =       "4",
  pages =        "1171--1175",
  keywords =     "field effect transistors;linear colliders;nuclear
                 electronics;position sensitive particle
                 detectors;readout electronics;semiconductor
                 counters;128 pixels;22 micron;36 micron;64 pixels;8192
                 pixels;CURO II;DEPFET pixel vertex
                 detector;International Linear Collider;Switcher
                 II;active pixel sensor;chip zero suppression;current
                 based readout chip;current memory cells;depleted field
                 effect transistor;internal gate;noise
                 performance;pedestal subtraction;prototype module;row
                 wise operation;signal charge;steering chips;thin
                 detectors;triggerless operation;Charge
                 measurement;Current
                 measurement;Detectors;Electrons;Energy
                 consumption;FETs;Prototypes;Semiconductor device
                 measurement;Spatial resolution;Testing;Active pixel
                 sensor;CURO;DEPFET;International Linear Collider
                 (ILC);vertex detector",
  DOI =          "10.1109/TNS.2005.852719",
  ISSN =         "0018-9499",
  month =        aug,
}
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