by L. Andricek, P. Fischer, F. Giesen, K. Heinzinger, S. Herrmann, D. Herz, M. Karagounis, R. Kohrs, H. Krüger, P. Lechner, G. Lutz, H. G. Moser, I. Perić, L. Reuen, R. H. Richter, C. Sandow, M. Schnecke, F. Schopper, L. Struder, E. von Törne, J. Treis, M. Trimpl, J. Velthuis, N. Wermes and S. Wolfel
Reference:
The MOS-type DEPFET pixel sensor for the ILC environment (L. Andricek, P. Fischer, F. Giesen, K. Heinzinger, S. Herrmann, D. Herz, M. Karagounis, R. Kohrs, H. Krüger, P. Lechner, G. Lutz, H. G. Moser, I. Perić, L. Reuen, R. H. Richter, C. Sandow, M. Schnecke, F. Schopper, L. Struder, E. von Törne, J. Treis, M. Trimpl, J. Velthuis, N. Wermes and S. Wolfel), In Nuclear Science Symposium Conference Record, 2005 IEEE, volume 1, 2005.
Bibtex Entry:
@InProceedings{1596212,
author = "L. Andricek and P. Fischer and F. Giesen and K.
Heinzinger and S. Herrmann and D. Herz and M.
Karagounis and R. Kohrs and H. Krüger and P. Lechner
and G. Lutz and H. G. Moser and I. Perić and L. Reuen
and R. H. Richter and C. Sandow and M. Schnecke and F.
Schopper and L. Struder and E. von Törne and J. Treis
and M. Trimpl and J. Velthuis and N. Wermes and S.
Wolfel",
title = "The {MOS-type} {DEPFET} pixel sensor for the {ILC}
environment",
booktitle = "Nuclear Science Symposium Conference Record, 2005
IEEE",
year = "2005",
volume = "1",
pages = "83--87",
month = oct,
doi = "10.1109/NSSMIC.2005.1596212",
ISSN = "1095-7863",
keywords = "MOSFET;X-ray effects;gamma-ray effects;position
sensitive particle detectors;silicon radiation
detectors;ILC environment;International Linear
Collider;MOS-type {DEPFET} active pixel
sensors;beam-beam interactions;biasing
conditions;double metal/double poly technology;electron
pair production;hard X-ray irradiation;hard gamma ray
irradiation;ionizing radiation;linear MOS-type {DEPFET}
sensors;pixel array read out;positive oxide
charges;positron+electron pair background;threshold
voltage;ultrathin fully depleted sensors;vertex
detector;Detectors;Electrons;Ionization;Ionizing
radiation;Ionizing radiation sensors;MOS devices;Paper
technology;Sensor arrays;Threshold voltage;X-rays",
}