Performance of a DEPFET prototype module for the ILC vertex detector (bibtex)
by L. Reuen, R. Kohrs, J. J. Velthuis, L. Andricek, P. Fischer, F. Giesen, H. Krüger, G. Lutz, M. Mathes, H. G. Moser, I. Perić, R. H. Richter, C. Sandow, E. von Törne, M. Trimpl, J. Treis and N. Wermes
Reference:
Performance of a DEPFET prototype module for the ILC vertex detector (L. Reuen, R. Kohrs, J. J. Velthuis, L. Andricek, P. Fischer, F. Giesen, H. Krüger, G. Lutz, M. Mathes, H. G. Moser, I. Perić, R. H. Richter, C. Sandow, E. von Törne, M. Trimpl, J. Treis and N. Wermes), In Nuclear Science, IEEE Transactions on, volume 53, 2006.
Bibtex Entry:
@Article{1645092,
  author =       "L. Reuen and R. Kohrs and J. J. Velthuis and L.
                 Andricek and P. Fischer and F. Giesen and H. Krüger
                 and G. Lutz and M. Mathes and H. G. Moser and I. Perić
                 and R. H. Richter and C. Sandow and E. von Törne and
                 M. Trimpl and J. Treis and N. Wermes",
  title =        "Performance of a {DEPFET} prototype module for the
                 {ILC} vertex detector",
  journal =      "Nuclear Science, IEEE Transactions on",
  year =         "2006",
  volume =       "53",
  number =       "3",
  pages =        "1719--1725",
  month =        jun,
  doi =          "10.1109/TNS.2006.873079",
  ISSN =         "0018-9499",
  keywords =     "field effect transistors;particle track
                 visualisation;position sensitive particle
                 detectors;readout electronics;semiconductor
                 counters;DEPFET pixel detector;DEPFET prototype;ILC;ILC
                 Vertex Detector;charm quarks;electron test beam;long
                 lived bottom quarks;noise sources;particle
                 detector;proposed International Linear Collider;readout
                 chain;semiconductor;tracking;transistor
                 structure;Biomedical measurements;Biomedical optical
                 imaging;Detectors;Electron beams;Extraterrestrial
                 measurements;Particle beams;Prototypes;Semiconductor
                 device noise;Spatial resolution;Testing;DEPFET
                 pixels;ILC;particle detector;pixel
                 detectors;semiconductor;tracking",
}
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