Counting and Integrating Readout for Direct Conversion X-ray Imaging: Concept, Realization and First Prototype Measurements (bibtex)

by E. Kraft, P. Fischer, M. Karagounis, M. Koch, H. Krueger, Ivan Peric, N. Wermes, Christoph Herrmann, A. Nascetti, Michael Overdick and W. Ruetten

Reference:

Counting and Integrating Readout for Direct Conversion X-ray Imaging: Concept, Realization and First Prototype Measurements (E. Kraft, P. Fischer, M. Karagounis, M. Koch, H. Krueger, Ivan Peric, N. Wermes, Christoph Herrmann, A. Nascetti, Michael Overdick and W. Ruetten), In Nuclear Science, IEEE Transactions on, volume 54, 2007.

Bibtex Entry:

@Article{4155097,
  author =       "E. Kraft and P. Fischer and M. Karagounis and M. Koch
                 and H. Krueger and Ivan Peric and N. Wermes and
                 Christoph Herrmann and A. Nascetti and Michael Overdick
                 and W. Ruetten",
  title =        "Counting and Integrating Readout for Direct Conversion
                 {X}-ray Imaging: Concept, Realization and First
                 Prototype Measurements",
  journal =      "Nuclear Science, IEEE Transactions on",
  year =         "2007",
  volume =       "54",
  number =       "2",
  pages =        "383--390",
  month =        apr,
  doi =          "10.1109/TNS.2007.891571",
  ISSN =         "0018-9499",
  keywords =     "X-ray imaging;current-mode circuits;current-mode
                 logic;feedback amplifiers;image sensors;photon
                 counting;X-ray imaging;charge integration;charge
                 sensitive amplifier;feedback circuit;low-swing
                 differential current mode logic;micrometer
                 technology;photon counting;pixel
                 electronics;semiconductor sensors;signal
                 processing;Biomedical equipment;Computed
                 tomography;Dynamic range;Image sensors;Medical
                 services;Optoelectronic and photonic
                 sensors;Pixel;Prototypes;Signal processing;X-ray
                 imaging;Direct conversion;X-ray imaging;semiconductor
                 sensors;single photon counting",
}