@Article{5446501,
  author =       "I. Perić and T. Armbruster and M. Koch and C. Kreidl
                 and P. Fischer",
  title =        "{DCD} - The Multi-Channel Current-Mode {ADC} Chip for
                 the Readout of {DEPFET} Pixel Detectors",
  journal =      "Nuclear Science, IEEE Transactions on",
  year =         "2010",
  volume =       "57",
  number =       "2",
  pages =        "743--753",
  month =        apr,
  doi =          "10.1109/TNS.2010.2040487",
  ISSN =         "0018-9499",
  keywords =     "analogue-digital conversion;nuclear
                 electronics;position sensitive particle
                 detectors;readout electronics;semiconductor
                 counters;Belle II;CMOS technology;DEPFET particle
                 pixel-detectors;ILC;NMOS gate layouts;automated digital
                 error correction;conversion time;current-mode ADC
                 chip-prototype;current-mode memory cells;cyclic
                 ADC;drain current digitizer;high radiation
                 tolerance;high spatial resolution;multichannel
                 current-mode;radiation-hard circuits;signal-to-noise
                 ratio;signed-digit cyclic conversion;static power
                 consumption;vertex detectors;CMOS
                 technology;Detectors;Error correction;Noise
                 measurement;Semiconductor device measurement;Signal
                 processing;Signal resolution;Signal to noise
                 ratio;Spatial resolution;Time measurement;Belle
                 II;DEPFET detector;ILC;current copier;current-mode A/D
                 converter;current-mode memory cell;cyclic (algorithmic)
                 A/D converter;switched-current memory cell",
}