A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL (bibtex)
by G. De Vita, L. Bombelli, M. Porro, S. Herrmann, A. Wassatsch, S. Facchinetti, C. Fiorini and F. Erdinger
Reference:
A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL (G. De Vita, L. Bombelli, M. Porro, S. Herrmann, A. Wassatsch, S. Facchinetti, C. Fiorini and F. Erdinger), In Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE, 2010.
Bibtex Entry:
@InProceedings{5873733,
  author =       "G. {De Vita} and L. Bombelli and M. Porro and S.
                 Herrmann and A. Wassatsch and S. Facchinetti and C.
                 Fiorini and F. Erdinger",
  title =        "A {5MHz} low-noise 130nm {CMOS} analog front-end
                 electronics for the readout of non-linear {DEPFET}
                 sensor with signal compression for the European
                 {XFEL}",
  booktitle =    "Nuclear Science Symposium Conference Record (NSS/MIC),
                 2010 IEEE",
  year =         "2010",
  pages =        "139--144",
  month =        oct,
  doi =          "10.1109/NSSMIC.2010.5873733",
  ISSN =         "1095-7863",
  keywords =     "CMOS analogue integrated circuits;X-ray imaging;X-ray
                 lasers;field effect transistors;filters;free electron
                 lasers;operational amplifiers;readout
                 electronics;European X-ray free electron laser;European
                 XFEL;X-ray images;analog filter;drain readout;frequency
                 4.5 MHz;low-noise CMOS analog front-end
                 electronics;nonlinear {DEPFET} sensor;operational
                 amplifier;signal compression;size 0.13 mum;source
                 follower;trapezoidal shaping function;voltage 1.2
                 V;Current measurement;Dynamic range;Logic
                 gates;Noise;Photonics;Pixel;Semiconductor device
                 measurement",
}
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