by Ladislav Andricek, Zdeněk Doležal, Zbyněk Drásal, Peter Fischer, Peter Kodyš, Robert Kohrs, Peter Kvasnička, Carlos Mariñas, Lars Reuen, Stefan Rummel, Kristof Schmieden, Jaap J. Velthuis and Marcel Vos
Reference:
Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests (Ladislav Andricek, Zdeněk Doležal, Zbyněk Drásal, Peter Fischer, Peter Kodyš, Robert Kohrs, Peter Kvasnička, Carlos Mariñas, Lars Reuen, Stefan Rummel, Kristof Schmieden, Jaap J. Velthuis and Marcel Vos), In Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, volume 604, 2009.
Bibtex Entry:
@Article{Andricek2009385,
title = "Spatial resolution analysis of micron resolution
silicon pixel detectors based on beam and laser tests",
journal = "Nuclear Instruments and Methods in Physics Research
Section A: Accelerators, Spectrometers, Detectors and
Associated Equipment",
volume = "604",
number = "1-2",
pages = "385--389",
year = "2009",
note = "{PSD8Proceedings} of the 8th International Conference
on Position Sensitive Detectors",
ISSN = "0168-9002",
DOI = "10.1016/j.nima.2009.01.097",
author = "Ladislav Andricek and Zdeněk Doležal and Zbyněk
Drásal and Peter Fischer and Peter Kodyš and Robert
Kohrs and Peter Kvasnička and Carlos Mariñas and Lars
Reuen and Stefan Rummel and Kristof Schmieden and Jaap
J. Velthuis and Marcel Vos",
keywords = "Silicon pixel detectors;Detector resolution;Laser
test;Beam test;n-Correction;Multiple scattering",
}