Publikationen P. Fischer & Arbeitsgruppe

by Velthuis J. J., Drasal Z., Hanninger G., Kohrs R., Mathes M., Reuen L., Scheirich D., Andricek L., Pascual I. C., Chen X., Doležal Z., Fischer P., Frey A., Fuster J. A., Koch M., Kodyš P., Kvasnička P., Krüger H., Llacer C. L., Lodomez P., Moser H. G., Peric I., Raspereza A., Richter R. H., Rummel S., Törne E. von and Wermes N.

Reference:

A DEPFET Based Beam Telescope With Submicron Precision Capability (Velthuis J. J., et al.), In Nuclear Science, IEEE Transactions on, volume 55, 2008.

Bibtex Entry:

@Article{4448546,
  author =       "J. J. Velthuis and Z. Drasal and G. Hanninger and R.
                 Kohrs and M. Mathes and L. Reuen and D. Scheirich and
                 L. Andricek and I. C. Pascual and X. Chen and Z.
                 Doležal and P. Fischer and A. Frey and J. A. Fuster
                 and M. Koch and P. Kodyš and P. Kvasnička and H.
                 Krüger and C. L. Llacer and P. Lodomez and H. G. Moser
                 and I. Peric and A. Raspereza and R. H. Richter and S.
                 Rummel and E. von Törne and N. Wermes",
  journal =      "Nuclear Science, IEEE Transactions on",
  title =        "A {DEPFET} Based Beam Telescope With Submicron
                 Precision Capability",
  year =         "2008",
  volume =       "55",
  number =       "1",
  pages =        "662--666",
  keywords =     "MOSFET;image sensors;position sensitive particle
                 detectors;readout electronics;DEPFET pixel
                 detector;International Linear Collider;MOSFET pixel
                 detector;beam telescope;bottom quarks;charm
                 quarks;current based readout chip;depleted silicon bulk
                 sensor;device under test;high energy particle beam;long
                 lived particles;pixel telescope;secondary
                 vertices;submicron precision capability;track
                 extrapolation error;Detectors;Extrapolation;MOSFET
                 circuits;Particle beams;Sensor phenomena and
                 characterization;Silicon;Space
                 technology;Telescopes;Testing;Uncertainty;Active pixel
                 sensor;DEPFET;International Linear Collider (ILC);solid
                 state detector;vertex detector",
  DOI =          "10.1109/TNS.2007.914031",
  ISSN =         "0018-9499",
  month =        feb,
}