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Publikationen P. Fischer & Arbeitsgruppe

[11]Measurement of the t-channel single top-quark production cross section in pp collisions at with the ATLAS detector (), In Physics Letters B, volume 717, . [bibtex] [doi]
[10]Measurement of the b-hadron production cross section using decays to final states in pp collisions at with the ATLAS detector (), In Nuclear Physics B, volume 864, . [bibtex] [doi]
[9]Measurement of Wγ and Zγ production cross sections in pp collisions at and limits on anomalous triple gauge couplings with the \ATLAS\ detector (), In Physics Letters B, volume 717, . [bibtex] [doi]
[8]Live-Cell Assays to Identify Regulators of ER-to-Golgi Trafficking (), In Traffic, Wiley-Blackwell, volume 13, . [bibtex] [doi]
[7] Infrastructure for Detector Research and Development towards the International Collider (), Technical report arXiv:1201.4657, CERN, . [bibtex] [url]
[6]An FPGA-based readout module for the DAQ subsystem of the DSSC detector at the European XFEL (), In 2012 18th IEEE-NPSS Real Time Conference, . [bibtex] [doi]
[5]Search for lepton flavour violation in the $ e \mu $ continuum with the ATLAS detector in $ \sqrt {s} $ = 7 TeV $ p p $ collisions at the LHC (), In European Physical Journal C: Particles and Fields, Springer Science + Business Media, volume 72, . [bibtex] [doi]
[4]Multi-channel charge pulse amplification, digitization and processing ASIC for detector applications (), In Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE, . [bibtex] [doi]
[3]The APA pixel readout ASIC for an APD based fast 2D X-ray hybrid pixel detector (), In Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE, . [bibtex] [doi]
[2]The DSSC pixel readout ASIC with amplitude digitization and local storage for DEPFET sensor matrices at the European XFEL (), In , . [bibtex] [doi]
[1]Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL (), In IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), volume 59, . [bibtex] [doi]

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