Publikationen P. Fischer & Arbeitsgruppe

by Treis J., Fischer P., Halker O., Harter M., Herrmann S., Kohrs R., Krüger H., Lechner P., Lutz G., Perić I., Porro M., Richter R. H., Struder L., Trimpl M. and Wermes N.

Reference:

DEPMOSFET Active Pixel Sensor Prototypes for the XEUS Wide Field Imager (Treis J., et al.), In Nuclear Science, IEEE Transactions on, volume 52, 2005.

Bibtex Entry:

@Article{1495809,
  author =       "J. Treis and P. Fischer and O. Halker and M. Harter
                 and S. Herrmann and R. Kohrs and H. Krüger and P.
                 Lechner and G. Lutz and I. Perić and M. Porro and R.
                 H. Richter and L. Struder and M. Trimpl and N. Wermes",
  journal =      "Nuclear Science, IEEE Transactions on",
  title =        "{DEPMOSFET} Active Pixel Sensor Prototypes for the
                 {XEUS} Wide Field Imager",
  year =         "2005",
  volume =       "52",
  number =       "4",
  pages =        "1083--1091",
  keywords =     "CMOS integrated circuits;X-ray apparatus;X-ray
                 astronomy;astronomical techniques;data
                 acquisition;readout electronics;semiconductor
                 counters;4096 pixel;64 channel parallel CMOS
                 amplifier/multiplexer IC;64 pixel;75 micron;8-fold
                 correlated double sampling;DAQ;DEPFET;DEPMOSFET active
                 pixel sensor prototypes;MPI semiconductor
                 laboratory;SWITCHER type IC;X-ray astronomy;X-ray
                 evolving universe spectroscopy;XEUS wide field
                 imager;charge amplifier multiplexer;charge collection
                 efficiency;control IC;data acquisition system;depleted
                 P-channel MOSFET;fast readout speed;first prototype
                 production;front-end IC;high energy resolution;high
                 voltage CMOS technology;highly flexible readout
                 modes;key performance parameters;large area imaging;low
                 power consumption;noise;one single matrix
                 row;performance characterization;random
                 accessibility;spectral resolution;spectroscopy
                 detector;CMOS technology;Data
                 acquisition;High-resolution imaging;Image
                 sensors;Laboratories;MOSFET
                 circuits;Multiplexing;Optical imaging;Pixel;
                 Prototypes;Active pixel sensor (APS);DEPFET;X-ray;X-ray
                 evolving universe spectroscopy (XEUS);data acquisition
                 (DAQ);imaging;spectroscopy",
  DOI =          "10.1109/TNS.2005.852673",
  ISSN =         "0018-9499",
  month =        aug,
}