Publikationen P. Fischer & Arbeitsgruppe

by Treis J., Fischer P., Halker O., Harter M., Herrmann S., Kohrs R., Kruger H., Lechner P., Lutz G., Peric I., Porro M., Richter R. H., Struder L., Trimpl M. and Wermes N.

Reference:

DEPMOSFET active pixel sensor prototypes for the XEUS wide field imager (Treis J., et al.), In Nuclear Science Symposium Conference Record, 2004 IEEE, volume 2, 2004.

Bibtex Entry:

@InProceedings{1462378,
  author =       "J. Treis and P. Fischer and O. Halker and M. Harter
                 and S. Herrmann and R. Kohrs and H. Kruger and P.
                 Lechner and G. Lutz and I. Peric and M. Porro and R. H.
                 Richter and L. Struder and M. Trimpl and N. Wermes",
  booktitle =    "Nuclear Science Symposium Conference Record, 2004
                 IEEE",
  title =        "{DEPMOSFET} active pixel sensor prototypes for the
                 {XEUS} wide field imager",
  year =         "2004",
  volume =       "2",
  pages =        "1019--1023 Vol. 2",
  keywords =     "CMOS integrated circuits;MOSFET;X-ray detection;X-ray
                 spectrometers;data acquisition;nuclear
                 electronics;position sensitive particle
                 detectors;prototypes;readout electronics;semiconductor
                 counters;semiconductor device noise;75 mum;8-fold
                 correlated double sampling;CAMEX type multiplexer
                 IC;CAMEX type parallel CMOS amplifier;DEPMOSFET active
                 pixel sensor prototypes;DEPMOSFET device;DEPMOSFET
                 matrix design variants;SWITCHER type control IC;XEUS
                 wide field imager;charge collection efficiency;data
                 acquisition system;depleted p-channel MOSFET;device
                 readout;energy resolution;front-end IC;high voltage
                 CMOS technology;matrix row;noise;pixel size;prototype
                 production;random pixel accessibility;readout
                 hybrid;readout modes;readout speed;signal
                 processing;spectral resolution;CMOS technology;Data
                 acquisition;Energy resolution;Image
                 sensors;Laboratories;MOSFET
                 circuits;Pixel;Production;Prototypes;Sensor phenomena
                 and characterization",
  doi =          "10.1109/NSSMIC.2004.1462378",
  ISSN =         "1082-3654",
  month =        oct,
}