Publikationen P. Fischer & Arbeitsgruppe

by Guazzoni A. Cand C., Porro S. Mand M., Fischer F. Eand P. and Manghisoni M. Kand M.

Reference:

Qualification of a high-resolution on-chip injection circuit for the calibration of the DSSC X-ray imager for the European XFEL (Guazzoni A. Cand C., et al.), In 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC), volume , 2018.

Bibtex Entry:

@InProceedings{8824409,
  author =       "A. {Castoldi} and C. {Guazzoni} and S. {Maffessanti}
                 and M. {Porro} and F. {Erdinger} and P. {Fischer} and
                 M. {Kirchgessner} and M. {Manghisoni}",
  booktitle =    "2018 IEEE Nuclear Science Symposium and Medical
                 Imaging Conference Proceedings (NSS/MIC)",
  title =        "Qualification of a high-resolution on-chip injection
                 circuit for the calibration of the {DSSC} {X}-ray
                 imager for the European {XFEL}",
  year =         "2018",
  volume =       "",
  number =       "",
  pages =        "1--3",
  keywords =     "application specific integrated
                 circuits;calibration;digital-analogue conversion;free
                 electron lasers;nuclear electronics;position sensitive
                 particle detectors;readout electronics;semiconductor
                 counters;X-ray imaging;miniSDD-F2 chip;target gain
                 mode;DEPFET Sensor with Signal
                 Compression;high-resolution on-chip injection
                 circuit;injected charge;F2 DAC;electrical injection
                 circuit;DSSC instrument;F2 readout ASIC;individual
                 pixel channel;x-ray imaging detectors;on-chip
                 sources;European XFEL;DSSC X-ray imager;Voltage
                 measurement;Capacitance;Europe;Semiconductor device
                 measurement;Qualifications;System-on-chip;Detectors",
  doi =          "10.1109/NSSMIC.2018.8824409",
  ISSN =         "2577-0829",
  month =        nov,
}