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Publikationen P. Fischer & Arbeitsgruppe

by Blanquart L., Richardson J., Einsweiler K., Fischer P., Mandelli E., Meddeler G. and Peric I.
Reference:
FE-I2: a front-end readout chip designed in a commercial $ 0.25 \mu {}m $ process for the ATLAS pixel detector at LHC (Blanquart L., et al.), In Nuclear Science, IEEE Transactions on, volume 51, 2004.
Bibtex Entry:
@Article{1323697,
  author =       "L. Blanquart and J. Richardson and K. Einsweiler and
                 P. Fischer and E. Mandelli and G. Meddeler and I.
                 Peric",
  journal =      "Nuclear Science, IEEE Transactions on",
  title =        "{FE-I2}: a front-end readout chip designed in a
                 commercial $ 0.25 \mu {}m $ process for the {ATLAS}
                 pixel detector at {LHC}",
  year =         "2004",
  volume =       "51",
  number =       "4",
  pages =        "1358--1364",
  keywords =     "high energy physics instrumentation computing;leakage
                 currents;nuclear electronics;position sensitive
                 particle detectors;readout electronics;silicon
                 radiation detectors;ATLAS pixel detector;CERN;CMOS
                 process;FE-I1;FE-I2 front-end readout chip;LHC;Large
                 Hadron Collider accelerator facility;active bias
                 distribution;automatic threshold tuning
                 circuitry;buffers;capacitance calibration charge-pump
                 circuit;charge-sensitive amplifier;detection
                 threshold;differential readout circuit;digital hit
                 emulation;digital pick-up reduction;embedded smart
                 decoupling capacitances;fast discriminator;hybrid pixel
                 sensor;ionizing radiation dose;leakage current
                 compensation;leakage current monitoring circuit;linear
                 regulator;long term overvoltage protection;multichip
                 module;pixel element dimension;power-on
                 reset;preamplifier-kill;radiation tolerance;readout
                 mask;recovery-time;shielding
                 technique;single-event-upset-tolerant DAC;slow control
                 logic;threshold
                 adjustment;time-over-threshold;time-stamped
                 data;wired-hit-Or; Automatic control;Automatic logic
                 units;CMOS
                 process;Capacitance;Circuits;Detectors;Electrons;Laboratories;Large
                 Hadron Collider;Particle accelerators",
  DOI =          "10.1109/TNS.2004.832895",
  ISSN =         "0018-9499",
  month =        aug,
}

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