Publikationen P. Fischer & Arbeitsgruppe

by Andricek L, Doležal Z, Drásal Z, Fischer P, Kodyš P, Kohrs R, Kvasnička P, Mariñas C, Reuen L, Rummel S, Schmieden K, Velthuis JJ. and Vos M

Reference:

Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests (Andricek L, et al.), In Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, volume 604, 2009.

Bibtex Entry:

@Article{Andricek2009385,
  title =        "Spatial resolution analysis of micron resolution
                 silicon pixel detectors based on beam and laser tests",
  journal =      "Nuclear Instruments and Methods in Physics Research
                 Section A: Accelerators, Spectrometers, Detectors and
                 Associated Equipment",
  volume =       "604",
  number =       "1-2",
  pages =        "385--389",
  year =         "2009",
  note =         "{PSD8Proceedings} of the 8th International Conference
                 on Position Sensitive Detectors",
  ISSN =         "0168-9002",
  DOI =          "10.1016/j.nima.2009.01.097",
  author =       "Ladislav Andricek and Zdeněk Doležal and Zbyněk
                 Drásal and Peter Fischer and Peter Kodyš and Robert
                 Kohrs and Peter Kvasnička and Carlos Mariñas and Lars
                 Reuen and Stefan Rummel and Kristof Schmieden and Jaap
                 J. Velthuis and Marcel Vos",
  keywords =     "Silicon pixel detectors;Detector resolution;Laser
                 test;Beam test;n-Correction;Multiple scattering",
}