Publikationen P. Fischer & Arbeitsgruppe
by Gorelov I., Gorfine G., Hoeferkamp M., Mata-Bruni V., Santistevan G., Seidel S. C., Ciocio A., Einsweiler K., Emes J., Gilchriese M., Joshi A., Kleinfelder S., Marchesini R., McCormack F., Milgrome O., Palaio N., Pengg F., Richardson J., Zizka G., Ackers M., Comes G., Fischer P., Keil M., Martinez G., Perić I., Runolfsson Ö., Stockmanns T., Treis J., Wermes N., Gößling C., Hügging F., Klaiber-Lodewigs J., Krasel O., Wüstenfeld J., Wunstorf R., Barberis D., Beccherle R., Caso C., Cervetto M., Darbo G., Gagliardi G., Gemme C., Morettini P., Netchaeva P., Osculati B., Rossi L., Charles E., Fasching D., Blanquart L., Breugnon P., Calvet D., Clemens J. C., Delpierre P., Hallewell G., Laugier D., Mouthuy T., Rozanov A., Valin I., Andreazza A., Caccia M., Citterio M., Lari T., Meroni C., Ragusa F., Troncon C., Vegni G., Lutz G., Richter R. H., Rohe T., Boyd G. R., Skubic P. L., Šı́cho P., Tomasek L., Vrba V., Holder M., Ziolkowski M., Cauz D., Cobal-Grassmann M., D’Auria S., Lotto B. D, Papa C. del, Grassmann H., Santi L., Becks K. H., Lenzen G. and Linder C.
Reference:
Electrical characteristics of silicon pixel detectors (Gorelov I., et al.), In Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, volume 489, 2002.
Bibtex Entry:
@Article{Gorelov2002202,
title = "Electrical characteristics of silicon pixel
detectors",
journal = "Nuclear Instruments and Methods in Physics Research
Section A: Accelerators, Spectrometers, Detectors and
Associated Equipment",
volume = "489",
number = "1-3",
pages = "202--217",
year = "2002",
ISSN = "0168-9002",
DOI = "10.1016/S0168-9002(02)00557-0",
author = "I. Gorelov and G. Gorfine and M. Hoeferkamp and V.
Mata-Bruni and G. Santistevan and S. C. Seidel and A.
Ciocio and K. Einsweiler and J. Emes and M. Gilchriese
and A. Joshi and S. Kleinfelder and R. Marchesini and
F. McCormack and O. Milgrome and N. Palaio and F. Pengg
and J. Richardson and G. Zizka and M. Ackers and G.
Comes and P. Fischer and M. Keil and G. Martinez and I.
Perić and Ö. Runolfsson and T. Stockmanns and J.
Treis and N. Wermes and C. Gößling and F. Hügging
and J. Klaiber-Lodewigs and O. Krasel and J.
Wüstenfeld and R. Wunstorf and D. Barberis and R.
Beccherle and C. Caso and M. Cervetto and G. Darbo and
G. Gagliardi and C. Gemme and P. Morettini and P.
Netchaeva and B. Osculati and L. Rossi and E. Charles
and D. Fasching and L. Blanquart and P. Breugnon and D.
Calvet and J. C. Clemens and P. Delpierre and G.
Hallewell and D. Laugier and T. Mouthuy and A. Rozanov
and I. Valin and A. Andreazza and M. Caccia and M.
Citterio and T. Lari and C. Meroni and F. Ragusa and C.
Troncon and G. Vegni and G. Lutz and R. H. Richter and
T. Rohe and G. R. Boyd and P. L. Skubic and P.
Šı́cho and L. Tomasek and V. Vrba and M. Holder and
M. Ziolkowski and D. Cauz and M. Cobal-Grassmann and S.
D’Auria and B. De Lotto and C. del Papa and H.
Grassmann and L. Santi and K. H. Becks and G. Lenzen
and C. Linder",
keywords = "Silicon;Pixel;Semiconductor;Tracking",
}